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Git Commits -> Revision e3217f4

Revision e3217f4 by Hans Goudey (soc-2019-bevel-profiles)
July 26, 2019, 20:50 (GMT)
ProfileWidget sampling and display:
1. Added the ability to sample fewer segments from the profile path than
the number of control points.
2. Added a display for the sampled segment positions in the widget's display.
This isn't an essential feature, but it helps visualize where the segments
will be sampled while keeping the focus on the widget itself.

This commit also includes various smaller changes:
1. Resolving / deleting various TODO comments without affecting functionality
in each file.
2. Rewording and clarifying comments throughout the code.
3. Renaming variable names for better code readability.

Commit Details:

Full Hash: e3217f47afab4e5ed17ef3aff9ed9f910434fa6d
Parent Commit: 7e354dc
Lines Changed: +210, -230

5 Modified Paths:

/release/scripts/startup/bl_ui/properties_data_modifier.py (+4, -0) (Diff)
/source/blender/blenkernel/BKE_profile_widget.h (+1, -1) (Diff)
/source/blender/blenkernel/intern/profile_widget.c (+75, -69) (Diff)
/source/blender/bmesh/tools/bmesh_bevel.c (+114, -137) (Diff)
/source/blender/editors/interface/interface_draw.c (+16, -23) (Diff)
Tehnyt: Miika HämäläinenViimeksi päivitetty: 07.11.2014 14:18MiikaH:n Sivut a.k.a. MiikaHweb | 2003-2021